Monitoring of Emission Sources Using SIFT-MS

New Organic Monitoring Techniques - Session 2
Oral Presentation

Prepared by C. Allpress
Syft Technologies, 3 Craft Pl, Middleton, Christchurch, Canterbury, 8042, New Zealand

Contact Information: [email protected]; +64 204 139 7950


Identification of the sources of emissions of individual volatile compounds is a challenging analytical problem. Doing so can require an analytical technique that is rapid enough to generate spatial and/or temporal distribution data, as well as selective enough to quantify the analytes of interest.

Selected ion flow tube mass spectrometry (SIFT-MS) is a soft chemical ionization technique that can be used to directly quantify volatile organic or inorganic analytes. SIFT-MS achieves selectivity of analysis by interrogating the reactivity of analytes with up to 8 different ions, which allows rapid and selective quantitation. SIFT-MS can be used on-site to monitor whole air samples directly, or off-site to analyse samples collected on thermal desorption tubes.